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Analysis of stress in aircraft components using lock-in thermography
  • 所属机构名称：哈尔滨工业大学
  • 会议名称：2010 International Conference on Optical, Electronic and Electrical Materials, OEEM2010
  • 成果类型：会议
  • 会场：Kunming, China
  • 相关项目：基于红外探测的飞机蒙皮及机场跑道损伤检测技术研究
作者： Liu, Xun|Li, Xu-Dong|Zhang, Guang-Yu|Liu, Jun-Yan|
同会议论文项目
基于红外探测的飞机蒙皮及机场跑道损伤检测技术研究
期刊论文 8 会议论文 9 专利 1
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