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Static deflections analysis of micro-cantilevers beam under transverse loading
  • 所属机构名称：中北大学
  • 会议名称：International conference on Circuits, Systems, Electronics, Control and Signal Processing - Proceedi
  • 成果类型：会议
  • 相关项目：传感器可靠性研究与信息处理技术
作者： Bai Yanping Hao Yilonh|
同会议论文项目
传感器可靠性研究与信息处理技术
期刊论文 58 会议论文 11
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