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A circuit for robustness enhancement of the subthreshold SRAM bitcell in 65nm technology
  • 所属机构名称：安徽大学
  • 会议名称：2nd International Conference on Advanced Engineering Materials and Technology, AEMT 2012
  • 时间：2012
  • 成果类型：会议
  • 相关项目：高密度高可靠性亚阈值静态存储器的理论研究
作者： R. Li|J. Zhu|N. Bai|X. Wu|
同会议论文项目
高密度高可靠性亚阈值静态存储器的理论研究
期刊论文 23 会议论文 8
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