中文摘要：

进行了用原子力显微镜（AFM）推动纳米颗粒的研究，以解决因探针推动力方向受针尖形貌影响很难建立有效的操作模型，导致纳米颗粒操作不稳定，操作结果不可控的问题。为了预测AFM推动纳米颗粒后颗粒的位置，基于最小作用量原理，对操作纳米颗粒过程中的作用力进行了分析；考虑了探针针尖与纳米颗粒之间接触点上推动方向对操作力的影响，对纳米颗粒操作进行了建模。根据建立的操作模型，仿真模拟了纳米颗粒推动后颗粒的运动轨迹。最后通过多次试验进行了验证，试验数据表明该操作模型可以有效地预测纳米颗粒推动后的位置，提高了操作效率。

英文摘要：

The study of using atomic force microscope （AFM） to manipulate nanoparticles was conducted to deal with the problem that the AFM tip＇ s pushing direction is affected by the tip shape so an effective manipulation model is dif- ficult to establish, thus leading to unstable nanoparticle manipulation and uncontrollable manipulation result. To forecast nanoparticles＇ location, the force action in the nano-manipulation process was analyzed based on the least action principle, and a nanoparticle manipulation model was established with the consideration of the effect of the direction in pushing the contract point between the probe tip and a nanopaticle on manipulation. Then nanoparti- cles＇ trajectory was simulated according to the proposed model. Several experiments were performed and the results indicate that the proposed model can effectively estimate the position of a nanoparticle after pushing and improve the maneuvering efficiency.