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一种耐高温紫外正型光刻胶及光刻工艺
  • ISSN号:0023-074X
  • 期刊名称:《科学通报》
  • 时间:0
  • 分类:O631.1[理学—高分子化学;理学—化学]
  • 作者机构:华中科技大学光学与电子信息学院,武汉光电国家实验室,武汉430074
  • 相关基金:国家自然科学基金(51172081,51473058和51135005)资助
中文摘要:

光刻胶作为光刻技术中的关键性基础材料,其配方组成和光刻工艺对光刻胶的分辨率等性能有重要影响.以自制的酰胺-酰亚胺聚合物作为成膜树脂,与感光剂2,1,5-磺酰氯的衍生物等其他成分按一定比例配制成光刻胶,通过研究不同配比、不同光刻工艺条件下的光刻性能,得到了该光刻胶的最佳配方组成及最佳光刻工艺条件.该光刻胶的成像反差可达到约3.35;在最佳配方组成和最佳光刻工艺条件下,采用接触式曝光,可以获得最大约1?m的线宽分辨率,同时该光刻胶具有良好的耐热性,270℃高温下坚膜30 min,光刻图形未发现明显塌边现象。

英文摘要:

Photoresist is a crucial and fundamental material for photolithographic technology, which plays a vital role in microelectronic technique. The rapid development of lithography drives the microelectronic technique moving forward. With high-level and multifunctional photoresist, it can make finer patterns and meet the demand under harsh working environment such as high temperature. To evaluate the performance of the photoresist, one of the most important indicators is line/space resolution, while the composition of the photoresist and photolithographic process have a very significant influence on the resolution performance. Different composition may result in different photosensitivity and solubility of the photoresist, which have a significant impact on the performance. Moreover, the photolithographic processes include exposure dose(exposure time), developing time, the concentration of developer and so on. They all have severely affected the lithography pattern quality and lithography performance. Thus, the related research in detail is very necessary and it is conducive to maximize the performance of the photoresist and guide lithography process to be carried out smoothly as well. In this work, a high thermal-stability ultraviolet(UV) positive photoresist was obtained from the formulation of a self-made amide-imide copolymer as matrix resin, a 2,1,5-diazonaphthoquinone sulfonyl chloride derivative as photosensitizer, and solvent. The optimal composition and photolithographic process parameters was studied by simple variable method. It was found that the optimal composition was with the 1:4:10(mass ratio) proportion of photosensitizer, resin and solvent, and the optimal photolithographic process parameters were about 4500 r/min spin-coating, prebake 1 min at 110°C hot plate, 30 s exposure time, 25 s development time in 1.0% tetramethylamine hydroxide(TMAH) aqueous solution, and post bake 5 min at 120°C hot plate. The imaging contrast of this photoresist was about 3.35, which indicated that th

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期刊信息
  • 《科学通报》
  • 北大核心期刊(2011版)
  • 主管单位:中国科学院
  • 主办单位:中国科学院
  • 主编:周光召
  • 地址:北京东黄城根北街16号
  • 邮编:100717
  • 邮箱:csb@scichina.org
  • 电话:010-64036120 64012686
  • 国际标准刊号:ISSN:0023-074X
  • 国内统一刊号:ISSN:11-1784/N
  • 邮发代号:80-213
  • 获奖情况:
  • 首届国家期刊奖,中国期刊方阵“双高”期刊,第三届中国出版政府奖
  • 国内外数据库收录:
  • 美国化学文摘(网络版),美国数学评论(网络版),美国工程索引,日本日本科学技术振兴机构数据库,中国中国科技核心期刊,中国北大核心期刊(2004版),中国北大核心期刊(2008版),中国北大核心期刊(2011版),中国北大核心期刊(2014版),中国北大核心期刊(2000版)
  • 被引量:81792