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不同绝缘气体对内部故障电弧压力效应的影响
  • ISSN号:1001-1609
  • 期刊名称:《高压电器》
  • 时间:0
  • 分类:TP751[自动化与计算机技术—控制科学与工程;自动化与计算机技术—检测技术与自动化装置] TM642.2[电气工程—电力系统及自动化]
  • 作者机构:State Key Laboratory of Electrical Insulation and Power Equipment,Xi'an Jiaotong University, Xi'an 710049, China
  • 相关基金:supported by National Key Basic Research Program of China (973 Program) (No. 2015CB251002), National Natural Science Foundation of China (Nos. 51221005, 51177124), the Fundamental Research Funds for the Central Universities, the Program for New Century Excellent Talents in University and Shaanxi Province Natural Science Foundation of China (No. 2013JM-7010)
中文摘要:

This paper focuses on the simulation of a fault arc in a closed tank based on the magneto-hydrodynamic(MHD) method,in which a comparative study of three radiation models,including net emission coefficients(NEC),semi-empirical model based on NEC as well as the P1 model,is developed.The pressure rise calculated by the three radiation models are compared to the measured results.Particularly when the semi-empirical model is used,the effect of different boundary temperatures of the re-absorption layer in the semi-empirical model on pressure rise is concentrated on.The results show that the re-absorption effect in the low-temperature region affects radiation transfer of fault arcs evidently,and thus the internal pressure rise.Compared with the NEC model,P1 and the semi-empirical model with 0.7 <α< 0.83 are more suitable to calculate the pressure rise of the fault arc,where is an adjusted parameter involving the boundary temperature of the re-absorption region in the semi-empirical model.

英文摘要:

This paper focuses on the simulation of a fault arc in a closed tank based on the magneto-hydrodynamic (MHD) method, in which a comparative study of three radiation models, including net emission coefficients (NEC), semi-empirical model based on NEC as well as the P1 model, is developed. The pressure rise calculated by the three radiation models are compared to the measured results. Particularly when the senti-empirical model is used, the effect of different boundary temperatures of the re-absorption layer in the semi-empirical model on pressure rise is concentrated on. The results show that the re-absorption effect in the low-temperature region affects radiation transfer of fault arcs evidently, and thus the internal pressure rise. Compared with the NEC model, P1 and the semi-empirical model with 0.7 〈 α 〈 0.83 are more suitable to calculate the pressure rise of the fault arc, where is an adjusted parameter involving the boundary temperature of the re-absorption region in the semi-empirical model.

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期刊信息
  • 《高压电器》
  • 北大核心期刊(2011版)
  • 主管单位:西安高压电器研究院有限公司
  • 主办单位:西安高压电器研究院有限公司
  • 主编:薛晔
  • 地址:西安市西二环北段18号
  • 邮编:710077
  • 邮箱:gydq@zgydq.com
  • 电话:029-84225621 84221958 84225626
  • 国际标准刊号:ISSN:1001-1609
  • 国内统一刊号:ISSN:61-1127/TM
  • 邮发代号:52-36
  • 获奖情况:
  • 国家优秀科技期刊,机械工业优秀科技期刊,陕西省优秀科技期刊
  • 国内外数据库收录:
  • 俄罗斯文摘杂志,美国化学文摘(网络版),波兰哥白尼索引,荷兰文摘与引文数据库,美国剑桥科学文摘,英国科学文摘数据库,中国北大核心期刊(2004版),中国北大核心期刊(2008版),中国北大核心期刊(2011版),中国北大核心期刊(2014版),中国北大核心期刊(2000版)
  • 被引量:14425