中文摘要：

对生成测试芯片效率进行研究，提出了一种采用版图编辑器作图和批量参数化建模设计方法。缩短了设计周期，降低了设计难度。依据该方法，开发了一套针对工艺开发包的测试芯片，实验结果验证了其高效性。

英文摘要：

To study the efficiency of generating VLSI test chip, a method which uses a layout editor for drawing and models parameters in batch is proposed. This method can not only shorten design cycle, but also reduce difficulty. A set of test chips for PDK has been implemented by the method, and the final result proves the efficiency.