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Effects of substrate temperature on structural and electrical properties of SiO2-matrix boron-doped
  • ISSN号：0169-4332
  • 期刊名称：Applied Surface Science
  • 时间：2013.4.1
  • 页码：428-431
  • 相关项目：氧掺杂的镶嵌在碳化硅中硅纳米晶的制备及其缺陷研究
作者： Huang, Junjun|Zeng, Yuheng|Tan, Ruiqin|Wang, Weiyan|Yang, Ye|Dai, Ning|Song, Weijie|
同期刊论文项目
氧掺杂的镶嵌在碳化硅中硅纳米晶的制备及其缺陷研究
期刊论文 10
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