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Total Ionizing Dose (TID) Effects ofγRay Radiation on Switching Behaviors of Ag/AlOx/Pt RRAM Device
  • ISSN号：1931-7573
  • 期刊名称：Nanoscale Res. Lett.
  • 时间：2014
  • 页码：452-454
  • 相关项目：电阻随机存储器三维集成技术研究
作者： Jer-Chyi Wang|Liyang Pan|Jun Xu|Chao-Sung Lai|
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电阻随机存储器三维集成技术研究
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