石墨烯是近年来材料、电子和纳米科学中的热门研究课题之一。石墨烯独特的二维结构和原子尺度的平整性使其特别适合利用扫描探针显微镜进行深入研究。利用扫描探针显微镜可以对石墨烯样品的表面的电学、力学和光学等性质进行细致的表征;同时,还可以对石墨烯进行精细的纳米尺度微加工。本文以各种扫描探针显微镜为基础,综述了扫描探针显微镜在石墨烯研究中起到的重要的表征和加工作用。同时,还详细介绍了石墨烯表面研究中的最新进展,并对扫描探针显微镜在石墨烯研究中所具有的潜力进行了探讨。
In recent years,graphene has become an extremely hot topic in materials,electronic and nano-science research.For the unique two dimensional structure and smooth morphology in molecular scale of graphene which makes scanning probe microscopy(SPM) a dramatically strong tool to investigate graphene in a deep level.By using SPM,the surface properties of graphene such as electricity,mechanics and photology can be finely studied.Meanwhile,micro-fabrication in nano-level can also be achieved.In this article,the important role of SPM focused on characterization and processing in the investigation of graphene was fully summarized.In the mean time,the state-of-art evolution of graphene's surface research was presented in detail.Outlook of the potential function of SPM was given as well.