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亚阈值状态下MOSFET二维双区和单区静电势模型的比较
  • ISSN号:1004-373X
  • 期刊名称:《现代电子技术》
  • 时间:0
  • 分类:O177.91[理学—数学;理学—基础数学] O53[理学—等离子体物理;理学—物理]
  • 作者机构:School of Electricial and Electronics Engineering, North China Electric Power University, Beijing 102206, China
  • 相关基金:Project supported by the National Natural Science Foundation of China(Grant No.61176080)
中文摘要:

By performing the electronic structure computation of a Si atom, we compare two iteration algorithms of Broyden electron density mixing in the literature. One was proposed by Johnson and implemented in the well-known VASP code.The other was given by Eyert. We solve the Kohn-Sham equation by using a conventional outward/inward integration of the differential equation and then connect two parts of solutions at the classical turning points, which is different from the method of the matrix eigenvalue solution as used in the VASP code. Compared to Johnson’s algorithm, the one proposed by Eyert needs fewer total iteration numbers.

英文摘要:

By performing the electronic structure computation of a Si atom, we compare two iteration algorithms of Broyden electron density mixing in the literature. One was proposed by Johnson and implemented in the well-known VASP code.The other was given by Eyert. We solve the Kohn-Sham equation by using a conventional outward/inward integration of the differential equation and then connect two parts of solutions at the classical turning points, which is different from the method of the matrix eigenvalue solution as used in the VASP code. Compared to Johnson's algorithm, the one proposed by Eyert needs fewer total iteration numbers.

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期刊信息
  • 《现代电子技术》
  • 北大核心期刊(2014版)
  • 主管单位:陕西省信息产业厅
  • 主办单位:陕西电子杂志社 陕西省电子技术研究所
  • 主编:张郁(执行)
  • 地址:西安市金花北路176号陕西省电子技术研究所科研生产大楼六层
  • 邮编:710032
  • 邮箱:met@xddz.com.cn
  • 电话:029-93228979
  • 国际标准刊号:ISSN:1004-373X
  • 国内统一刊号:ISSN:61-1224/TN
  • 邮发代号:52-126
  • 获奖情况:
  • 中国科技核心期刊
  • 国内外数据库收录:
  • 波兰哥白尼索引,中国中国科技核心期刊,中国北大核心期刊(2014版)
  • 被引量:37245