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中文摘要：
介绍一套容量为1200V／150A的绝缘栅双极型晶体管（insulated gate bipolar transistor，IGBT）开关特性离线测试系统。该测试系统包括器件开关特性的硬件测试平台和开关损耗建模软件平台两部分。硬件测试平台将计算机作为控制中心，根据用户在LabVIEW界面上选择的母线电压、集电极电流、门极电压、门极电阻以及温度等参数，通过RS232接口控制DSP完成开关特性测试，通过GPIB接口设置示波器，保存记录的波形。软件建模平台利用记录的电压、电流波形数据，采用3种平均模型（幂函数模型，幂函数与多项式结合的模型，神经网络模型）建立开关损耗模型。该系统实现了电力电子器件开关特性测量和损耗模型建立，方便用户预测工作范围内任一测试条件下的器件开关损耗。
英文摘要：
An off-line Insulated gate bipolar transistor （IGBT） switch/ng characteristics measurement system was introduced. There are two parts in this system： a test platform and a modeling platform. A man-machine interface based on LabVIEW was adopted on the computer, through which users could choose parameters such as bus voltage, load current, temperature, gate voltage, and gate resistor. The computer performed serial communication with DSP via RS232 interface, controlled the oscilloscope via GPIB interface and recorded turn-on and turn-off current and voltage waveforrns. Switching losses models （power function model, power function and polynomial model, neural network model） were established on the basis of testing data. The switching characteristics measurement system has realized IGBT switching losses measurement and losses model establishment and provides switching losses forecast for device ushers.
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