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EPIR effect of Cu2O films by electrochemical deposition
ISSN号:1567-1739
期刊名称:Current Applied Physics
时间:2014.9
页码:1282-1286
相关项目:缺陷、深能级陷阱与CaCu3Ti4O12巨介电常数之间的关系
作者:
Yang, R.|Xiao, H. B.|Baerner, K.|Marchenkov, V. V.|
同期刊论文项目
缺陷、深能级陷阱与CaCu3Ti4O12巨介电常数之间的关系
期刊论文 50
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