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Effect of thermal cycle on the interfacial antiferromagnetic spin configuration and exchange bias in
  • ISSN号：2158-3226
  • 期刊名称：AIP Advances
  • 时间：2012
  • 页码：032181-
  • 相关项目：缺陷、深能级陷阱与CaCu3Ti4O12巨介电常数之间的关系
作者： V. V. Marchenkov|C. Tien|J.C.A. Huang|C. P. Yang|
同期刊论文项目
缺陷、深能级陷阱与CaCu3Ti4O12巨介电常数之间的关系
期刊论文 50
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