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基于能带调制模型的高压增强型AlGaN/GaN HFET器件
  • ISSN号:1000-3819
  • 期刊名称:固体电子学研究与进展
  • 时间:0
  • 页码:-
  • 分类:TN304.23[电子电信—物理电子学] TN386[电子电信—物理电子学]
  • 作者机构:[1]tate Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China, Chengdu 610054, China
  • 相关基金:Project supported by the National Natural Science Foundation of China (Grant No. 60906037), the Fundamental Research Funds for the Central Universities, China (Grant No. ZYGX2009J027), and the Foundation of State Key Laboratory of Electronic Thin Films and Integrated Devices.
  • 相关项目:高性能AlGaN/GaN复合阳极场控功率整流器新结构及模型
中文摘要:

In this paper,we present a monolithic integration of a self-protected AlGaN/GaN metal-insulator field-effect transistor(MISFET).An integrated field-controlled diode on the drain side of the AlGaN/GaN MISFET features a selfprotected function for a reverse bias.This diode takes advantage of the recessed-barrier enhancement-mode technique to realize an ultra-low voltage drop and a low turn-ON voltage.In the smart monolithic integration,this integrated diode can block a reverse bias(> 70 V/μm) and suppress the leakage current(< 5 × 10-11 A/mm).Compared with conventional monolithic integration,the numerical results show that the MISFET integrated with a field-controlled diode leads to a good performance for smart power integration.And the power loss is lower than 50% in conduction without forward current degeneration.

英文摘要:

In this paper, we present a monolithic integration of a self-protected AlGaN/GaN metal-insulator field-effect transistor (MISFET). An integrated field-controlled diode on the drain side of the AlGaN/GaN MISFET features a self- protected function for a reverse bias. This diode takes advantage of the recessed-barrier enhancement-mode technique to realize an ultra-low voltage drop and a low turn-ON voltage. In the smart monolithic integration, this integrated diode can block a reverse bias (〉 70 V/μm) and suppress the leakage current (〈 5 × 10-11 A/mm). Compared with conventional monolithic integration, the numerical results show that the MISET integrated with a field-controlled diode leads to a good performance for smart power integration. And the power loss is lower than 50% in conduction without forward current degeneration.

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期刊信息
  • 《固体电子学研究与进展》
  • 中国科技核心期刊
  • 主管单位:中国电子科技集团公司
  • 主办单位:南京电子器件研究所
  • 主编:杨乃彬
  • 地址:南京中山东路524号(南京160信箱43分箱)
  • 邮编:210016
  • 邮箱:gtdz@chinajournal.net.cn
  • 电话:025-86858161
  • 国际标准刊号:ISSN:1000-3819
  • 国内统一刊号:ISSN:32-1110/TN
  • 邮发代号:
  • 获奖情况:
  • 中国期刊方阵双效期刊,江苏省第六届优秀期刊,工信部09-10年期刊编辑质量优秀奖
  • 国内外数据库收录:
  • 美国化学文摘(网络版),荷兰文摘与引文数据库,中国中国科技核心期刊,中国北大核心期刊(2008版),中国北大核心期刊(2011版),中国北大核心期刊(2014版),中国北大核心期刊(2000版)
  • 被引量:2461