中文摘要：

本体异质结有机太阳能电池的活性层形貌对器件性能有着直接的影响。目前广泛应用的形貌表征手段如透射电子显微镜、原子力显微镜等在有机薄膜材料的形貌表征中都存在一定的局限性。共振软X射线散射克服了常用表征手段在有机薄膜表征中对比度低、三维信息缺失等缺点,利用软X射线照射下材料折射率的巨大不同获得更高的对比度,对表征有机太阳能电池活性层的相分离情况、理解微观结构、建立光电转化过程和形貌之间的关系有着重要意义。本文概述了活性层形貌对本体异质结有机太阳能电池性能的影响,介绍了共振软X射线散射的发展历程、基本原理及分析方法。在此基础上,综述了共振软X射线散射在有机太阳能电池形貌问题中应用,并对其应用前景作了展望。

英文摘要：

It is known that the active layer morphology of bulk heterojunction organic solar cells has significant impact on the performance of solar cell devices.However,the widely used morphology characterization methods such as transmission electron microscopy（TEM）,atomic force microscopy（AFM） have certain limitations in the characterization of organic thin film materials.By using the huge difference of the refractive index of the different materials under the soft X-ray,resonant soft X-ray scattering（R-SoXS） provides highly enhanced contrast,overcomes the drawbacks such as low contrast between/among different organic components and the lack of 3D information,which is important to obtain the phase separation information in the active layer of organic solar cells,to understand the microstructure,and to establish the relationship between the morphology and the photoelectric conversion process.This article provides an overview of the effect of active layer morphology on the performance of bulk heterojunction organic solar cells,introduces the developing process,theoretical background and the analysis method of resonant soft X-ray scattering.Based on these,the application of resonant soft X-ray scattering in the study of the morphology of organic solar cells is reviewed.The application prospects of R-SoXS are also discussed.