以玉米自交系R15(抗)×掖478(感)的229个F2单株为作图群体,构建了包含146个SSR标记位点的遗传连锁图谱,全长1666 cM,平均图距11.4 cM.通过麦粒嵌入法对F2:4群体进行人工接种纹枯病菌,并以相对病斑高为病级划分标准鉴定了玉米纹枯病的抗性.用复合区间作图法分析抗病QTL及遗传效应,共检测到9个抗性QTL,分布于第1、2、3、4、5、6和10条染色体上,单个QTL可解释表型方差的3.72%~7.19%,其中有2个QTL位于染色体6.01抗病基因簇附近.
Banded leaf-sheath blight (BLSB) caused by Rhizoctonia solani Ktihn in maize ( Zea mays L. ) is an important disease in China and Southeast Asia. Knowledge of the identification of quantitative trait loci (QTLs) for tolerance to this disease will facilitate the development of maize cultivars (hybrids) resistance. A genetic linkage map covered 1 666 cM on total ten chromosomes, with an average interval length of 11.4 cM was constructed using 146 simple sequence repeat (SSR) markers and the software MAPMAKER version 3.0b based on a maize population consisting of 229 F2 individuals derived from a cross R15 (resistant) x Ye 478 (susceptible). The disease index from the population of 229 F2:4 lines were evaluated for BLSB resistance under artificial inoculation. With the method of composite interval mapping (CIM) described in QTL Cartographer V2.0 procedure, 9 QTLs controlling resistance to BLSB were identified on chromosomes 1, 2, 3, 4, 5, 6 and 10, accounting for 3.72% to 7.19% of the phenotypic variance. Among them, two QTLs were located in the region of 6.01 of chromosome where the resistance genes were usually located, which will be the important QTLs in the future study.