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Study of etched ion track profiles in silicon dioxide membrane
ISSN号:1350-4487
期刊名称:Radiation Measurements
时间:0
页码:S627-S631
语言:英文
相关项目:荷能重离子径迹刻蚀法制备硅基膜纳米孔道
作者:
Liang, A. F.|Liu, Y. D.|Zhang, W. M.|Guo, W.|Li, J.|Xue, J. M.|Wang, Y. G.|
同期刊论文项目
荷能重离子径迹刻蚀法制备硅基膜纳米孔道
期刊论文 8
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