中文摘要：

Pr部分替代Ca可以在Bi-2223的超导层中引起局域缺陷（简称Pr离子缺陷），本文分析了不同含Pr量的Bi-2223／Ag带材在垂直于带面的外场下电阻转变特性，研究了其磁通钉扎势垒的变化规律．结果表明：Pr离子缺陷显著提高了Bi-2223带材的磁通钉扎势垒（U）．不同含Pr量样品的磁通钉扎势垒（U）均满足U／（1-Tirr／Tco）（1／H^α的规律．其不同α值反映了样品中不同的磁通蠕动方式．在不含Pr离子缺陷的样品中．磁通主要以双弯结的方式进行蠕动，含Pr离子缺陷的样品中磁通蠕动主要以直接剪切的方式进行．

英文摘要：

The resistive transitions of （Bi, Pb）2 Sr2Ca2-xPrxCu3Oy silver sheathed tapes with x= 0.0, 0. 001, 0. 002 have been measured under applied magnetic fields oriented perpendicular to tape plane （H//c） from 0 to 7T. The transitions can be well agreed with the thermally activated flux creep model by Anderson： R（T,H） = R0 exp[- U（H）/kBT] in the low resistance range. The calculated activation energies U （H） of flux motion mcreased drastically in the samples with proper amount of Pr-ion defects. For our samples, U are all well fitted with the law of U/（1 - Tirr/Tco） ∝ 1/H^α） , and the markedly changed α indicated the flux creep according to varied manners in different samples. Most of the flux creep by double kinks in the tape without Pr-ion defects, while that through directly lattice shearing in the tapes with Pr-ion defects.