中文摘要：

运用原子力显微术AFM（atomic force microscopy,AFM）观察了ADP晶体生长时相界面上动态微观形貌的变化并测算了台阶传播速率。实验结果表明，在相变驱动力介于0．005—0．05kT／ωs，生长温度介于20-40℃之间时，相变界面表现出台阶面的基本特征；相变界面上台阶推移的动力学系数体现出溶质输运趋向于体扩散控制；微晶融合的过程说明ADP晶体生长中，微晶融入与大分子晶体的同类过程有所不同，不会形成晶体缺陷。

英文摘要：

By in situ atomic force microscopy （AFM）, the dynamic topographic changes were observed on the phase interface of ADP crystals and the step propagation rates of ADP crystals were measured when phase transition drive force was within 0.005 -0.05 kT/ωs and the temperature was within 20-40℃. The results of AFM experiments indicate that the phase interface is basely characterized by step surface, The step kinetic coefficient shows that the mass transfer is controlled by bulk diffusion. The process of ADP micro-crystals incorporation is different from similar process of macromolecular crystals, which doesn＇t result in crystal defect