中文摘要：

双频光栅投影的小波变换轮廓术中，投影具有高低两个载频的双频光栅在被测物体表面，通过小波分析提取出两条小波脊线，从而根据这两条脊线计算出对应的两组相位信息．为了得到满意的测量结果，两个光栅载频之间必须满足一定的关系．在此，通过对双频光栅投影的小波变换轮廓术进行频谱分析，从理论上导出了采用该方法获得正确的相位所必需遵循的结构条件和抽样条件，并根据高低频率之间内在关系，通过获取可靠的低频相位展开级次来指导高频截断相位的展开，保证了相位展开的可靠性．给出了完整的理论推导过程以及计算机模拟，证实了理论的正确性．

英文摘要：

Wavelet Transform Profilometry based on dual-frequency fringe pattern projects a grating fringe with dual-frequency components onto an object. From the two wavelet ridge-lines extracted by wavelet analysis method, two sets of wrapped phase information can be calculated. In order to obtain the satisfying result, the two fringe carrier frequencies must follow some rules. In this paper, the structure condition and sampling condition of the proposed method is studied from the aspect of frequency analysis. Only when both of the two conditions are satisfied, the right restore result can be obtained. In addition, the phase is unwrapped according to the inherent relationship between the low and the high frequency. The unwrapping order relating to the low frequency is more reliable, so it can be used to direct the unwrapping process of the high frequency, which guarantees the reliability of the unwrapping process. The complete theoretical deduction and computer simulations verify the correction of the theory.