用Cu离子交换技术制备了玻璃平面光波导,利用IWKB法与离子浓度计算折射率的方法结合,得到了Cu^+和Cu^2+相对应的折射率分布。当离子交换深度较深时,折射率变化主要是由Cu^+引起,且折射率变化较小;而当深度较浅时,折射率变化则是由Cu^+和Cu^2+共同作用的结果,而Cu^2+的对折射率变化的贡献集中在玻璃表面。通过离子浓度计算得出5min交换时间的折射率分布呈现准梯度折射率分布形状,而随着离子交换时间的增加所制备的平面波导通过棱镜耦合无法测到波导模式,这可能是由于波导表面折射率下降所致,其机理可能是由于Cu^+的外扩散和大离子直径的Cu^2+在玻璃表面附近产生的应力在高温下退火被释放的共同结果。
Planar optical waveguides were fabricated by copper ion-exchange. Refractive index profiles caused by Cu^+ and Cu^2+ were determined by the inverse-WKB method and the calculation from the profile of the ion concentrations. The result shows that the index changes were caused by Cu^+ and Cu^2+ in the region near the surface,the changes in the deep region were caused by Cu^+ ,and Cu^2+ only contributed to the index changes in the region near the surface. The index profile calculated from the ion concentrations also appeared to be a quasi-gradient index profile,and when the exchange process was carlied out for more than 5 min,the samples measured by prism-coupling technique showed no modes, Which could be caused by the decrease of the surface index of the waveguides. Both the out-diffusion of Cu^+ and the stress release of Cu^2+ caused by anneal contributed to the decrease of the surface index.