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Reducing the Effect of Surface Emissivity Variation in Eddy Current Pulsed Thermography
  • ISSN号：1530-437X
  • 期刊名称：IEEE Sensors Journal
  • 时间：2014.4.1
  • 页码：1137-1142
  • 相关项目：基于磁光成像的近表面缺陷定量无损评估算法研究
作者： Libing Bai|Shulin Tian|Yuhua Cheng|Gui Yun Tian|Yifan Chen|Kai Chen|
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基于磁光成像的近表面缺陷定量无损评估算法研究
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