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Fast crack profile reconstruction using pulsed eddy current signals
  • ISSN号：0963-8695
  • 期刊名称：NDT & E International
  • 时间：2012.12.11
  • 页码：37-44
  • 相关项目：基于磁光成像的近表面缺陷定量无损评估算法研究
作者： Libing Bai|Gui Yun Tian|Shulin Tian|Yuhua Cheng|
同期刊论文项目
基于磁光成像的近表面缺陷定量无损评估算法研究
期刊论文 12 会议论文 8
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