中文摘要：

采用磁控溅射法制备了系列[Co0.55mm／Cu]30（t=0．6，0．9，1．2，1．5，1．8，2．1，2．4，2．7，3．0）非连续多层膜样品，并利用四探针法研究了Cu层厚度、退火温度以及周期数对薄膜巨磁阻（GMR）效应的影响。磁电阻测量表明，随着非铁磁层Cu层厚度的增加，薄膜样品的GMR效应总体呈下降趋势，并出现了振荡现象；经退火处理后，薄膜的GMR效应呈先增大后减小的趋势，在350℃达到最大，为．5．1％；薄膜的GMR效应随着周期数的增加而增大，当周期数为50时趋于恒定。

英文摘要：

[Co0.55mm/Cut]30 discontinuous multilayer films（t=0.6,0.9,1.2,1.5,1.8,2.1,2.4,2.7,3.0） were grown on Cr buffer layer which deposited on glass substrates by magnetron sputtering. The effects of Cu layer thickness, annealing temperature and period number on GMR of [Coo55/Cu]30 films were stud- ied by four-point probe method. The results of magnetic resistance measurement show that with the increase of the Cu-layer thickness, the GMR effect of the film samples appears the overall down- ward trend and the emergence of oscillations. then decreases with the increase of annealing 350 ℃. The GMR effect increases with period period number is 50. After annealed, the GMR effect first increases and temperature, which reaches the maximum-5.1% at number increasing, and reaches a steady value when