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Optimal production lot size with process deterioration under an extended inspection policy
  • ISSN号:1004-4132
  • 期刊名称:系统工程与电子技术(英文版)
  • 时间:0
  • 页码:768-776
  • 语言:中文
  • 分类:TN97[电子电信—信号与信息处理;电子电信—信息与通信工程]
  • 作者机构:[1]Dept. of Mathematics, Tianjin Univ., Tianjin 300072, P. R. China
  • 相关基金:This project was supported by the National Natural Science Foundation of China (60874034).
  • 相关项目:偏微分网络系统的控制
中文摘要:

Hu Fei was born in 1977. He is the Ph. D. candidate in School of Electrical Engineering and Automation and a lecture in Department of Mathematics, Tianjin University. His research interests include system modeling and reliability analysis. E-mail: hfzdzy@126.com Xu Genqi was born in 1959. Now he is a professor in Department of Mathematics, Tianjin University. He received his Ph.D. degree from the System Science In-stitute of Chinese Academy of Sciences. His research interests are spectral theory of linear operator, system stability and reliability analysis, etc. Ma Lixia was born in 1978. She is the Ph.D. candidate in School of Electrical Engineering and Automation and a lecture in Department of Mathematics, Tianjin University. Her research interest is in system stability analysis.

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期刊信息
  • 《系统工程与电子技术:英文版》
  • 主管单位:中国航天机电集团
  • 主办单位:中国航天工业总公司二院
  • 主编:高淑霞
  • 地址:北京海淀区永定路52号
  • 邮编:100854
  • 邮箱:jseeoffice@126.com
  • 电话:010-68388406 68386014
  • 国际标准刊号:ISSN:1004-4132
  • 国内统一刊号:ISSN:11-3018/N
  • 邮发代号:82-270
  • 获奖情况:
  • 航天系统优秀期刊奖,美国工程索引(EI)和英国科学文摘(SA)收录
  • 国内外数据库收录:
  • 荷兰文摘与引文数据库,美国工程索引,美国剑桥科学文摘,美国科学引文索引(扩展库),英国科学文摘数据库
  • 被引量:242