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Experimental characterization and modeling of the bending strain effect on flexible microwave diodes
  • ISSN号：0003-6951
  • 期刊名称：Applied Physics Letters
  • 时间：2011.12.12
  • 页码：-
  • 相关项目：超高速柔性单晶硅电子器件及多功能电路的研究
作者： Qin, Guoxuan|Yang, Laichun|Seo, Jung-Hun|Yuan, Hao-Chih|Celler, George K.|Ma, Jianguo|Ma, Zhenqiang|
同期刊论文项目
超高速柔性单晶硅电子器件及多功能电路的研究
期刊论文 25 会议论文 2 专利 2
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