投影栅相位法是三维轮廓测量的热点方法之一,主要用于测量物体表面三维形貌和离面变形位移场等。根据投影栅相位法三维测量原理,提出了一种实现光栅相移精密控制的方法,详细阐述了整个装置实现控制的过程。通过对实际物体的测量,证明了该方法的有效性。将实验结果用于三维图像的重构,得出的物体三维图像表明:此种方法可以完好地实现投影栅相位法对物体的测量,其测量数据准确、测量过程可靠,并且大大提高了投影栅相位法的测量效率。
Projected grating is one of the hot methods of three-dimensional profile measurements.It is primarily used to measure the three-dimensional shape of object surface and the displacement field of deformations away from object surfaces.A method is proposed to achieve precision control of grating phase-shifting and the process to achieve control of the whole system for details is elaborated,based on the theory of projected grating three-dimensional measurements.This method is proved effectively by the dimension of a physical object.When the result is used to reconstruct the three-dimensional graphics,it is found that this method can perfectly achieve the dimension of objects with precise data and reliable process by projected grating and increase the efficiency of projected grating.