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中文摘要：
采用通常的固相反应方法在不同烧结条件下制备了钙钛矿氧化物La1-xSrxCoO3（0≤x≤0．5）系列样品，通过粉末X射线衍射分析确定了体系的结构，由Rietveld方法拟合得到晶格参数随Sr掺杂量的变化．在80K-300K温度范围的直流电阻率测量表明，材料的电性质在x=0．2和0．3之间展示了从半导体到金属的相变．x=0．2样品已接近绝缘体-金属（I—M）相变的边缘．研究结果表明La1-xSrxCoO3体系的I—M相变不仅依赖于Sr浓度x，也依赖于样品的制备技术．并对结构与电阻率的关系进行了讨论．
英文摘要：
The perovskite oxide La1-xSrxCoO3（ 0 ≤ x≤ 0. 5） series were prepared under different sintering conditions by a standard solid-state reaction method. Crystal structure was determined by powder X-ray diffraction and lattice parameters as a function of Sr-concentration x were obtained by using Rietveld method. The dc-resistivity investigated in the temperature range of 80-300 K indicates that, the electric properties exhibit a metal-insulator （semiconducting） （I-M） transition for 0.2〈x〈0.3. The sample with x-0.2 is close to the M-I transition boundary. Our result shows that Metal--Insulator transition of La1-xSrxCoO3 system not only depends on Sr-content x, but also on the preparation techniques. The relationship between the structure and resistivity is discussed.
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