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Novel bandgap-based under-voltage-lockout methods with high reliability
ISSN号:1674-4926
期刊名称:Chinese Journal of Semiconductors
时间:2013
页码:-
相关项目:高性能高效率高频率电源芯片设计研究
作者:
Zhao, Yongrui|Lai, Xinquan|
同期刊论文项目
高性能高效率高频率电源芯片设计研究
期刊论文 34
会议论文 6
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期刊信息
《半导体学报:英文版》
中国科技核心期刊
主管单位:中国科学院
主办单位:中国电子学会 中国科学院半导体研究所
主编:李树深
地址:北京912信箱
邮编:100083
邮箱:cjs@semi.ac.cn
电话:010-82304277
国际标准刊号:ISSN:1674-4926
国内统一刊号:ISSN:11-5781/TN
邮发代号:2-184
获奖情况:
90年获中科院优秀期刊二等奖,92年获国家科委、中共中央宣传部和国家新闻出版署...,97年国家科委、中共中央中宣传部和国家新出版署三等奖,中国期刊方阵“双效”期刊
国内外数据库收录:
俄罗斯文摘杂志,美国化学文摘(网络版),荷兰文摘与引文数据库,美国工程索引,美国剑桥科学文摘,英国科学文摘数据库,日本日本科学技术振兴机构数据库,中国中国科技核心期刊,中国北大核心期刊(2004版),中国北大核心期刊(2008版),英国英国皇家化学学会文摘,中国北大核心期刊(2000版)
被引量:7754