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Design of the test architecture for IP cores on SoC based on IEEE 1500 Standard
  • 所属机构名称：桂林电子科技大学
  • 会议名称：International Conference on Information and Business Intelligence (IBI) 2011
  • 成果类型：会议
  • 会场：chongqing
  • 相关项目：基于多目标进化算法的内建自测试（BIST）优化设计技术研究
作者： Tan Enmin, Wang Peng|
同会议论文项目
基于多目标进化算法的内建自测试（BIST）优化设计技术研究
期刊论文 6 会议论文 5 专利 2
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