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A built-in self-test design with low power consumption based on genetic algorithm
  • 所属机构名称：桂林电子科技大学
  • 会议名称：9th International Conference on Electronic Measurement and Instruments, ICEMI 2009
  • 成果类型：会议
  • 会场：Beijing, China
  • 相关项目：基于多目标进化算法的内建自测试（BIST）优化设计技术研究
作者： Wang, Li|Tan, Enmin|
同会议论文项目
基于多目标进化算法的内建自测试（BIST）优化设计技术研究
期刊论文 6 会议论文 5 专利 2
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