位置：成果数据库 > 会议 > 会议详情页
New approach to process planning using feature-based techniques
  • 所属机构名称：西安交通大学
  • 会议名称：2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008
  • 成果类型：会议
  • 会场：Chengdu, China
  • 相关项目：测量数据的直接数控刀轨生成和工艺优化新技术研究
作者： Xu, Ai|Zhang, Yingjie|
同会议论文项目
测量数据的直接数控刀轨生成和工艺优化新技术研究
期刊论文 13 会议论文 14 专利 1
同项目会议论文
Image-based approach to generation of offset curves from point cloud
New approach to low contrast image segmentation
Hierarchical segmentation approach to detection of defects on welding radiographic images
Tool Path Optimization to Regulate the Cutting Forces in Pocket Machining
New edge detection approach by using linear filtering
New approach to computation of offset curves for point-based geometries
Automatic generation of initial contours on image segmentation
Region-based image fusion approach using iterative algorithm
New approach to defect detection for NDT applications by using topological derivative
A simple and efficient hybird image fusion approach
Image fusion with control of luminance contrasts via an iterative procedure
Two-step segmentation for speedup of convergence via preprocessing
Identification of an optimal set of cutting-tool sizes for machining polygonal surfaces