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New approach to defect detection for NDT applications by using topological derivative
  • 所属机构名称：西安交通大学
  • 会议名称：5th International Conference on Visual Information Engineering, VIE 2008
  • 成果类型：会议
  • 会场：Xi'an, China
  • 相关项目：测量数据的直接数控刀轨生成和工艺优化新技术研究
作者： Zhang, Y.J.|Ge, L.L.|
同会议论文项目
测量数据的直接数控刀轨生成和工艺优化新技术研究
期刊论文 13 会议论文 14 专利 1
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