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Enhanced dielectric characteristics of manganese-doped bzt thin films
  • 所属机构名称：电子科技大学
  • 会议名称：The 2nd International Symposium on Functional Materials
  • 成果类型：会议
  • 相关项目：铁电－铁磁多层复合薄膜中界面应力对结构和性能作用规律的研究
作者： Qin, W.F.|Li, Y.R.|Wei, X.H.|Zhu, J.|Zhang, Y.|Jie, W.J.|
同会议论文项目
铁电－铁磁多层复合薄膜中界面应力对结构和性能作用规律的研究
期刊论文 38 会议论文 7 专利 2
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