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一种计算微带天线互阻抗的新方法
  • 所属机构名称：中国科学技术大学
  • 会议名称：中国电子学会1999年全国天线理论电磁散射与逆散射学术会议
  • 作者或编辑：3448
  • 语言：中文
  • 成果类型：会议
  • 相关项目：半导体霍耳效应测量的无接触微波方法
作者： 尹逢春|朱旗|徐善驾|
同会议论文项目
半导体霍耳效应测量的无接触微波方法
期刊论文 5 会议论文 33
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