中文摘要：

基于扫描链技术的SoC芯片测试可产生比正常使用模式下更大的功耗,这将会对器件可靠性产生不利影响,故在测试时需要将芯片测试功耗控制在允许峰值功耗之下.文中采用蚁群优化思路设计SoC测试调度算法,用于在峰值功耗和TAM总线最大宽度约束下降低SoC测试时间.实验结果表明,本方法优于先前已发表的相关方法.

英文摘要：

The SoC IC generates much more power dissipation during testing which may cause reliability problem to the device.Hence,it is desirable to schedule the tests under the allowable peak power constraint.This work presents,based on the Ant Colony Optimization（ACO） algorithm,a test scheduling to reduce the test application time under the peak power constraint as well as the constraint of maximum TAM bus width.Experimental results show that the algorithm is more effective in reducing test time than the earlier published methods.