中文摘要：

由于在压缩测试时间和降低测试温度方面的作用,SoC测试调度技术引起了研究者的广泛关注.研究发现,芯片的功耗剖面与热剖面并不一致,而过多的热量才是导致芯片失效的直接原因,因此通过峰值功耗或平均功耗的约束来进行测试优化调度并不一定可以避免芯片过热.以峰值温度为约束,提出一种基于蚁群算法的SoC测试调度方法,用于避免芯片局部过热的现象.基准电路上的实验结果表明,该方法可在保证芯片热安全的条件下明显优化测试时间.

英文摘要：

The SoC test scheduling technique has attracted wide attention of researchers because it reduces the test time and decreases test temperature of the DUT.However,the power profile of DUT does not always follow its thermal counterpart,thus the average power or the peak power is not the suitable constraint for SoC test scheduling method to avoid the overheating of DUT,since it is the heat,not the power of the chip incurs the physical damages of DUTs.This paper proposes a SoC test scheduling method based on ant-colony algorithm taking peak temperature as the constraint to avoid the chip from local overheating.Experiment results on benchmark circuits show that this method can obviously reduce the test time while assuring the thermal safety of DUTs.