利用转移矩阵法研究了含单层负折射率缺陷的一维光子晶体缺陷模的光学特性。结果表明,随着缺陷层厚度的增加,缺陷模的频率呈现分阶段的变化。第一阶段为单调递增,第二阶段为过渡过程,第三阶段为单调递减。这些性质与缺陷层为正常材料的相应结构有很大的不同。尽管第三阶段与之有点相似,但此时移动的速度却较大。研究还发现,整个过程缺陷模移动得比缺陷层为正常材料时要快。
By using transfer-matrix method,optical properties of defect modes in one-dimensional photonic crystal containing a single defect layer with negative refractive index are studied.It is found that when the thickness of defect is increased,the frequency of defect modes can be changed presenting several stages.First stage is monotonously increased,second stage is a transitional process,and the third is monotonously decreased.These properties are different from those of the structure that defect layer has positive refractive index.Though the third stage is somewhat alike,but now defect modes move with greater speed.It is also found that in the whole process defect modes move faster than them in the structure containing a defect layer with positive refractive index.