欢迎您!
东篱公司
退出
申报数据库
申报指南
立项数据库
成果数据库
期刊论文
会议论文
著 作
专 利
项目获奖数据库
位置:
成果数据库
>
期刊
> 期刊详情页
Efficient Full-Chip Statistical Leakage Analysis Based on Fast Matrix Vector Product
ISSN号:0278-0070
期刊名称:IEEE Transactions on Computer-Aided Design of Inte
时间:2012.3
页码:356-369
相关项目:CMOS毫米波电路基于自动建模的验证方法
作者:
Gao, Mingzhi|Ye, Zuochang|Wang, Yan|Yu, Zhiping|
同期刊论文项目
CMOS毫米波电路基于自动建模的验证方法
期刊论文 11
会议论文 10
同项目期刊论文
A two-dimensional analysis method on STI-aware layout-dependent stress effect
A Framework for Layout-Dependent STI Stress Analysis and Stress-Aware Circuit Optimization
Noise Companion State-Space Passive Macromodeling for RF/mm-Wave Circuit Design
Model order reduction for large scale RC networks based on optimal elimination
Efficient statistical capacitance extraction of nanometer interconnects considering the on-chip line
大规模RC网络的优化消去模型降阶算法
<span style="font-family:;" arial","sans-serif";font-size:10pt;"=&q
Scalable compact modeling for on-chip passive elements with correlated parameter extraction and adap