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A two-dimensional analysis method on STI-aware layout-dependent stress effect
  • ISSN号：0018-9383
  • 期刊名称：IEEE Transactions on Electron Devices
  • 时间：2012
  • 页码：2964-2972
  • 相关项目：CMOS毫米波电路基于自动建模的验证方法
作者： Li, Xiaojian1|Ye, Zuochang1|Tan, Yaohua2|Wang, Yan1|
同期刊论文项目
CMOS毫米波电路基于自动建模的验证方法
期刊论文 11 会议论文 10
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