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A Framework for Layout-Dependent STI Stress Analysis and Stress-Aware Circuit Optimization
  • ISSN号：1063-8210
  • 期刊名称：IEEE Transactions on Very Large Scale Integration
  • 时间：2012.3
  • 页码：498-511
  • 相关项目：CMOS毫米波电路基于自动建模的验证方法
作者： Xue, Jiying|Deng, Yangdong|Ye, Zuochang|Wang, Hongrui|Yang, Liu|Yu, Zhiping|
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CMOS毫米波电路基于自动建模的验证方法
期刊论文 11 会议论文 10
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