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Composition depth profiles of Bi(3.15)Nd(0.85)Ti(3)O(12) thin films studied by X-ray photoelectron s
  • ISSN号：0169-4332
  • 期刊名称：Applied Surface Science
  • 时间：2011.6.6
  • 页码：7461-7465
  • 相关项目：铁电场效应晶体管保持性能损失过程中铁电畴变的实时观测与相场模拟
作者： Zhang, Z. H.|Zhong, X. L.|Liao, H.|Wang, F.|Wang, J. B.|Zhou, Y. C.|
同期刊论文项目
铁电场效应晶体管保持性能损失过程中铁电畴变的实时观测与相场模拟
期刊论文 26 会议论文 1 获奖 4
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