中文摘要：

利用傅立叶转换红外光谱和Raman谱仪分析了0．98GeV的Fe离子在电子能损Se为3．5keV／nm时，不同辐照剂量（5×10^10-8×10^13ions／cm^2）下，在C60薄膜中引起的辐照损伤效应。分析表明，Fe离子辐照引起了C60分子的聚合与损伤。在辐照剂量达到一中间值1×10^12ions／cm^2，C60分子的损伤得到部分恢复，归因于电子激发引起的退火效应。通过对Raman数据的拟合分析，演垂出Fe离子辐照在C60材料中形成的潜径迹截面或引起损伤的截面约为1．32×10^-14cm^2。

英文摘要：

The irradiation effects of C6o films induced by 0.98 GeV Fe ions at the same electronic energy loss of 3.5 keV/nm and different irradiation dose ranging from 5 ×10^10 to 8 × 10^13 ions/cm^2, were analyzed by Raman scattering and Fourier transform infrared （FTIR） spectroscopes. The analysis results indicate that the irradiation results in a molecular polymerization and destruction of the C60. The partial recovery of the damage at the intermediate value of irradiation dose, 1 × 10^12 ions/cm^2, was caused by an annealing effect of electronic energy loss. The ion track or damage cross-section σ deduced from the Raman data was 1.32 × 10^-14 cm^2.