中文摘要：

The structural modification of C 60 films induced by 300-keV Xe-ion irradiation was investigated.The irradiated C 60 films were analysed using Fourier transform infrared spectroscopy,the Raman scattering technique,ultraviolet/visible spectrophotometry and atomic force microscopy.The analysis results indicate that the Xe-ion irradiation induces polymerization and damage of the C 60 molecule and significantly modifies the surface morphology and the optical property of the C 60 films.The damage cross-section for the C 60 molecule was also evaluated.

英文摘要：

The structural modification of C60 films induced by 300-keV Xe-ion irradiation was investigated. The irradiated C60 films were analysed using Fourier transform infrared spectroscopy, the Raman scattering technique, ultraviolet/visible spectrophotometry and atomic force microscopy. The analysis results indicate that the Xe-ion irradiation induces polymerization and damage of the C60 molecule and significantly modifies the surface morphology and the optical property of the C60 films. The damage cross-section for the C60 molecule was also evaluated.