采用脉冲激光沉积法(PLD)在Pt衬底(Pt/TiO2/SiO2/Si)上制备了SrTiO3(STO)薄膜,并对其表面特性,表面组成和结构进行了研究分析。在此基础上制备了具有三明治结构的Au/STO/Pt阻变器件,并测试了其I-V特性。结果显示:空间电荷限制电流(SCLC)机制对SrTiO3薄膜中氧空位的运输起了决定作用;薄膜界面缺陷对载流子的俘获与去俘获导致了SrTiO3薄膜I-V特性的产生。
SrTiO3(STO) thin film was deposited on a Pt (Pt/TiO2/SiO2/Si) substrate by the pulsed laser deposition (PLD) method. The surface morphology, surface composition and crystal structure of the prepared film were studied. An Au/STO/Pt resistive switching device with a sandwich structure was then fabricated and the I-V characteristic of the device was investigated. The results show that the oxygen vacancy movement in the STO film is controlled by the space-charge-limited current (SCLS) mechanism, and the 1-V characteristic of the STO film is a result of electron trapping and releasing within the interface.