本文研究了Au/SrTiO3/Au三明治结构中的双极电阻翻转效应,观察到高、低阻态的电阻弛豫现象。低频噪声测量表明高、低阻态的电阻涨落表现出1/f 行为。对比试验表明,高阻态的低频噪声来源于反向偏置肖特基势垒和氧空位的迁移,强度较大,低阻态的噪声则源于类欧姆接触底电极区域的氧空位迁移导致的载流子涨落,强度较低。同时,界面上氧空位浓度的弛豫导致了高、低阻态的弛豫过程。
The resistance relaxation in Au/SrTiO3/Au sandwiches with bipolar resistance switching has been investigated by the low fre-quency analysis. The power spectral density of the conducting current fluctuation in the high resistance state and the low resistance state shows 1/f behaviors. By contrast experiment, the low frequency noise for the high resistance state is ascribed to the Schottky barrier under reverse bias and the oxygen vacancy diffusion, while the noise in the low resistance state is due to the carriers fluctuation arising from the oxygen vacancy migration. The resistance relaxation can be further understood as the diffusion of oxygen vacancies under an electric field.