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Effect of equivalent surface charge density on electrical field of positively beveled p-n junction
  • ISSN号:1812-1918
  • 期刊名称:《纳米科技》
  • 时间:0
  • 分类:O455[理学—无线电物理;理学—物理]
  • 作者机构:[1]School of Electronics and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, P. R. China, [2]School of Information and Communication Engineering, Harbin Engineering University, Harbin 150001, P. R. China
  • 相关基金:Project supported by the National Natural Science Foundation of China (Grant No.60036010)
中文摘要:

【正】The space-charge layer(SCL)and surface depletion area(SDA)model for beveled p-n junction is presented.The surface space-charge density is calculated for depletion case of beveled p-n junction.Based on the finite difference method, the effect of the equivalent surface charge density on the surface depletion area for positively beveled p-n junction is also studied.Thyristors passivated with polyimide(PI)or polyester improved silicon paint(SP)are fabricated to verify the effect of equivalent surface charge on the peripheral surface of beveled p-n junction.The change of leakage current is sensitive to the surface charges.It indicates that the selection of passivation materials is a significant process to ensure the breakdown voltage capability of beveled devices.

英文摘要:

The space-charge layer (SCL) and surface depletion area (SDA) model for beveled p-n junction is presented. The surface space-charge density is calculated for depletion case of beveled p-n junction. Based on the finite difference method, the effect of the equivalent surface charge density on the surface depletion area for positively beveled p-n junction is also studied. Thyristors passivated with polyimide (PI) or polyester improved silicon paint (SP) are fabricated to verify the effect of equivalent surface charge on the peripheral surface of beveled p-n junction. The change of leakage current is sensitive to the surface charges. It indicates that the selection of passivation materials is a significant process to ensure the breakdown voltage capability of beveled devices.

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期刊信息
  • 《纳米科技》
  • 主管单位:陕西省科学技术协会
  • 主办单位:西安纳米科技学会 陕西省电子学会纳米科技学会 西安纳米学会 陕西省电子学会纳米技术专业委员会
  • 主编:徐友龙
  • 地址:西安市科技路37号海星城市广场B座24层
  • 邮编:710075
  • 邮箱:namikeji2013@163.com
  • 电话:029-88153782
  • 国际标准刊号:ISSN:1812-1918
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  • 邮发代号:
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  • 被引量:857