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Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine
  • ISSN号：1687-5265
  • 期刊名称：Computational Intelligence and Neuroscience
  • 时间：2014
  • 页码：-
  • 相关项目：面向并行工程的电子系统测试性建模方法与技术
作者： Zhou Jingyu|Tian Shulin|Yang Chenglin|Ren Xuelong|
同期刊论文项目
面向并行工程的电子系统测试性建模方法与技术
期刊论文 18 会议论文 9
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