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Thermal Accumulation Effects on the Transient Temperature Responses in LDMOSFETs Under the Impact of
  • ISSN号：0018-9383
  • 期刊名称：Ieee Transactions On Electron Devices
  • 时间：0
  • 页码：345-352
  • 相关项目：复杂舰船平台中通信系统的电磁环境效应机理研究
作者： Zhen Ren|Wen-Yan Yin|Yan-Bing Shi|Qing Huo Liu|
同期刊论文项目
复杂舰船平台中通信系统的电磁环境效应机理研究
期刊论文 23 会议论文 21
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